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Table top X-ray scanning microscopy for the multiple length scale investigation of smart materials.
Giannini C., Altamura D., Ladisa M., De Caro L., Sibillano T., Siliqi D.
A non-destructive structural and morphological characterization is required during the different fabrication phases of a novel material. X-rays offer key features such as large penetration depth (up to several mm), short wavelength (\AA ngstrom) and atomic chemical contrast. X-ray scattering-based scanning microscopy is today available in laboratory, as realized at the XMI-L@b, thanks to novel synchrotron-like table-top microsources which allow to reach high-brilliance focused beams for $ex situ$ dedicated experiments. Examples will be given of table-top Small and Wide Angle X-Ray Scattering-based Scanning Microscopy of hierarchical materials investigated across different length scales: atomic, nanoscopic as well as microscopic. The authors acknowledge financial support of "Progetti di Grande Rilevanza 2017 Italia-Messico - Ministero degli Affari Esteri e dalla Cooperazione Internazionale, Direzione Generale per la Promozione del Sistema Paese"