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Raman and SERS mapping of EUV-irradiated graphene.

Botti S., Mezi L., Rufoloni A., Vannozzi A., Gay S., Rindzevicius T., Schmidt M. S.
  Venerdì 15/09   09:00 - 12:00   Aula A224   II - Fisica della materia
The extreme ultra-violet (EUV) irradiation influence on structural properties of graphene was studied by Raman and surface-enhanced Raman spectroscopy (SERS) mapping. Thin films of multi-layer graphene were prepared and deposited on gold-coated Si nano-pillar substrates and subsequently irradiated with the ENEA Xe-feeded EUV source, emitting on the 10--18 nm wavelength band (69--124 eV). The irradiation produces drastic changes in the Raman and SERS spectra of graphene, which can be interpreted as a fragmentation of graphene flakes, with consequent $sp^{2}$ bond strain, accompanied by a desorption of functional groups, residues of the manufacturing process, that are present in the pristine sample.